SHRIMP Sample Preparation Facility

SHRIMP sample preparation
High-quality sample preparation is the foundation for accurate and precise SHRIMP analysis.
SHRIMP sample format: 25mm standard mounts (left) or thin sections (right)
Sample format: 25mm standard mounts (left) or thin sections (right)
A planning diagram and the corresponding map of a standard 25 mm sample mount. It includes 24 regions of interest drilled from 20 different mounts or thin sections.
Planning diagram (left) and map (right) of a 25 mm mount with 24 regions of interest.
Zircon grains (left) and apatite grains (right) mounted on heat-resistant tape for sample preparation.
Zircon (left) and apatite (right) grains mounted on heat-resistant tape. Grid size: 2 mm x 2 mm
Sectioned cattle tooth (upper panel) and horse tooth (lower panel) prepared for SHRIMP analysis, showing internal structures.
Sectioned cattle tooth (upper panel) and horse tooth (lower panel) prepared for SHRIMP analysis
Giant kangaroo tooth embedded in epoxy (left), SHRIMP analysis spots marked along the enamel-dentine junction (center), and a magnified view of SHRIMP spots (right), each approximately 20 microns in size.
Giant kangaroo tooth and 20-micron SHRIMP spots

Requirements for SHRIMP Samples

To ensure accurate and precise SHRIMP analysis, samples must meet the following requirements:

  • Sample Format: Standard mounts (25 mm round disks) or thin sections.
  • Material Types: Geological minerals, biominerals, or synthetic materials.
  • Preparation Guidelines:
    • Polished to achieve a flat, smooth surface.
    • Cleaned to eliminate contamination.
    • Dried in a vacuum oven to remove gases.
    • Coated with a conductive material (e.g., gold or aluminium).
    • Characterised using optical or electron imaging.

 

 

 

 

Bench drill used for extracting regions of interest (ROI).
Bench drill for extracting regions of interest.
Precision saw with examples of its applications.
Precision saw and its applications.
Struers polisher
Struers polisher
Leica microscope (left) and JEOL-6610A SEM (right) for sample characterization.
Leica microscope (left) and JEOL-6610A SEM (right).
Evaporative coater (left) and sputter coater (right) for coating applications.
Evaporative coater (left) and sputter coater (right).

SHRIMP Sample Preparation Facility 

Our facility is equipped with state-of-the-art tools for precise sample preparation and imaging:

  • Cutting & Drilling:
    • Bosch PBD 40 Bench Drill
    • Struers Secotom-60 Precision Cutting Machine
  • Embedding, Grinding & Labelling:
    • Struers CitoVac Vacuum Impregnation Unit
    • Struers LaboPol-20 Grinding/Polishing System
    • Groovy CNC Mill
  • Microscopy:
    • Olympus SZ61 Stereomicroscope
    • Leica DM EP Microscope
    • Leica DM6000M Automated Research Microscope
  • Electron Imaging:
    • JEOL-6610A Scanning Electron Microscope (SEM) with cathodoluminescence (CL), backscattered electron imaging (BSE), and qualitative electron dispersive spectroscopy (EDS).
  • Coating Systems:
    • Leybold-Heraeus Univex 300 Evaporation Coater
    • Leica EM ACE600 Sputter Coater

 

 

 

Contact

jiade.wu@anu.edu.au